Improvement of physical properties of ZnO thin films by tellurium doping
| dc.authorid | 0000-0002-6011-3504 | en_US |
| dc.authorid | 0000-0002-2626-4050 | en_US |
| dc.contributor.author | Sönmezoğlu, Savaş | |
| dc.contributor.author | Akman, Erdi | |
| dc.date.accessioned | 2019-12-06T21:17:18Z | |
| dc.date.available | 2019-12-06T21:17:18Z | |
| dc.date.issued | 2014 | |
| dc.department | KMÜ, Mühendislik Fakültesi, Metalurji ve Malzeme Mühendisliği Bölümü | en_US |
| dc.description | 9th Nanoscience and Nanotechnology Conference (NANOTR) -- JUN 24-28, 2013 -- Erzurum, TURKEY | en_US |
| dc.description | WOS:000344380500056 | en_US |
| dc.description.abstract | This investigation addressed the structural, optical and morphological properties of tellurium incorporated zinc oxide (Te-ZnO) thin films. The obtained results indicated that Te-doped ZnO thin films exhibit an enhancement of band gap energy and crystallinity compared with non-doped films. The optical transmission spectra revealed a shift in the absorption edge toward lower wavelengths. X-ray diffraction measurement demonstrated that the film was crystallized in the hexagonal (wurtzite) phase and presented a preferential orientation along the c-axis. The XRD obtained patterns indicate that the crystallite size of the thin films, ranging from 23.9 to 49.1 nm, changed with the Te doping level. The scanning electron microscopy and atomic force microscopy results demonstrated that the grain size and surface roughness of the thin films increased as the Te concentration increased. Most significantly, we demonstrate that it is possible to control the structural, optical and morphological properties of ZnO thin films with the isoelectronic Te-incorporation level. (C) 2014 Elsevier B.V. All rights reserved. | en_US |
| dc.description.sponsorship | European Cooperation in Science and Technology through COST Action [MP1302]; Scientific and Technological Research Council of Turkey (TUBITAK)Turkiye Bilimsel ve Teknolojik Arastirma Kurumu (TUBITAK) [112T981] | en_US |
| dc.description.sponsorship | Authors would like to thank the European Cooperation in Science and Technology through COST Action MP1302 Nanospectroscopy and the Scientific and Technological Research Council of Turkey (TUBITAK Grant number 112T981) for the financial support of this research. | en_US |
| dc.identifier.citation | Sönmezoğlu, S., Akman, E. (2014). Improvement of physical properties of ZnO thin films by tellurium doping. Applied Surface Science, Volume 318, 1 November 2014, Pages 319-323. | en_US |
| dc.identifier.doi | 10.1016/j.apsusc.2014.06.187 | |
| dc.identifier.endpage | 323 | en_US |
| dc.identifier.issn | 0169-4332 | |
| dc.identifier.issn | 1873-5584 | |
| dc.identifier.scopus | scopusidyok | |
| dc.identifier.startpage | 319 | en_US |
| dc.identifier.uri | https://dx.doi.org/10.1016/j.apsusc.2014.06.187 | |
| dc.identifier.uri | https://hdl.handle.net/11492/3093 | |
| dc.identifier.volume | 318 | en_US |
| dc.identifier.wos | WOS:000344380500056 | |
| dc.identifier.wosquality | N/A | |
| dc.indekslendigikaynak | Web of Sceince | |
| dc.indekslendigikaynak | Scopus | |
| dc.institutionauthor | Sönmezoğlu, Savaş | |
| dc.institutionauthor | Akman, Erdi | |
| dc.language.iso | en | |
| dc.publisher | Elsevier Science BV | en_US |
| dc.relation.journal | Applied Surface Science | en_US |
| dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.subject | Te-doped ZnO | en_US |
| dc.subject | Sol-Gel Method | en_US |
| dc.subject | Microstructure and Optical Properties | en_US |
| dc.title | Improvement of physical properties of ZnO thin films by tellurium doping | en_US |
| dc.type | Article |
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