The effects of temperature and frequency changes on the electrical characteristics of hot-injected Cu2MnSnS4 chalcogenide-based heterojunction

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dc.authorid0000-0003-1463-9764en_US
dc.authorid0000-0002-3689-0469en_US
dc.contributor.authorSarılmaz, Adem
dc.contributor.authorÖzel, Faruk
dc.contributor.authorKarabulut, Abdulkerim
dc.contributor.authorOrak, Ikram
dc.contributor.authorŞahinkaya, Mehmet Akif
dc.date.accessioned2020-02-19T08:17:44Z
dc.date.available2020-02-19T08:17:44Z
dc.date.issued2020en_US
dc.departmentKMÜ, Mühendislik Fakültesi, Metalurji ve Malzeme Mühendisliği Bölümüen_US
dc.descriptionWOS:000510641000031en_US
dc.description.abstractCu2MnSnS4 chalcogenide was obtained with the help of hot-injection technique and used as an interfacial thin layer to examine its behavior under varying temperature and frequency conditions. The well-known XRD, SEM and EDX techniques were utilized in the analysis of structural and content. To investigate the electrical properties, the variations in current, capacitance, conductance and impedance depending on the changing voltage were investigated. In the current-voltage measurements, measurements were made in distinct temperatures in addition to room temperature, and the effect of the temperature on the basic electrical parameters such as barrier height and ideality factor was investigated. The results showed that the temperature significantly affected the electrical properties. However, capacitance, impedance and conductance measurements were carried out for various frequencies. The performed experiments indicate that the fabricated heterojunction-based device using Cu2MnSnS4 chalcogenide could be evaluated in the wide temperature applications and enhanced as a capacitor in the electronic technology.en_US
dc.description.sponsorshipThis work is supported by Karamanoglu Mehmetbey University BILTEM (Scientific and Technological Research and Application Center) and TUBITAK (The Scientific and Technological Research Council of Turkey) under project number 217M212 .
dc.identifier.citationSarilmaz, A., Ozel, F., Karabulut, A., Orak, I., & Şahinkaya, M. A. (2020). The effects of temperature and frequency changes on the electrical characteristics of hot-injected Cu2MnSnS4 chalcogenide-based heterojunction. Physica B: Physics of Condensed Matter, 580, 2020.en_US
dc.identifier.doi10.1016/j.physb.2019.411821
dc.identifier.issn0921-4526
dc.identifier.issn1873-2135
dc.identifier.scopus2-s2.0-85075374531
dc.identifier.scopusqualityQ2
dc.identifier.urihttps://doi.org/10.1016/j.physb.2019.411821
dc.identifier.urihttps://hdl.handle.net/11492/3371
dc.identifier.volume560en_US
dc.identifier.wosWOS:000510641000031
dc.identifier.wosqualityQ3
dc.indekslendigikaynakWeb of Sceince
dc.indekslendigikaynakScopus
dc.institutionauthorSarılmaz, Adem
dc.institutionauthorÖzel, Faruk
dc.language.isoen
dc.publisherElsevieren_US
dc.relation.journalPhysica B: Condensed Matteren_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectElectrical Characterizationen_US
dc.subjectCu2mnsns4 (Cmts) Chalcogenideen_US
dc.subjectTemperature And Frequency Effectsen_US
dc.subjectHot-İnjection Techniqueen_US
dc.titleThe effects of temperature and frequency changes on the electrical characteristics of hot-injected Cu2MnSnS4 chalcogenide-based heterojunctionen_US
dc.typeArticle

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